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|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | S300 |
| MOQ: | 1 unit |
| Delivery Time: | 2-8 weeks |
| Payment Terms: | T/T |
S300 DC SMU Source Measure Unit 300V 1A For Electrical Characteristic Testing
The S300 Source Measure Unit, developed by PRECISE INSTRUMENT over many years, is a high-precision, wide dynamic range, and digitally interactive domestically produced source meter. It integrates multiple functions such as voltage and current input/output and measurement. With a maximum output voltage of 300V, a maximum output current of 1A, and a minimum test current resolution of 10pA, it supports four-quadrant operation, making it widely applicable for various electrical characteristic testing and analysis, including semiconductor ICs, components, power devices, sensors, organic materials, and nanomaterials.
Product Features
▪ High-Precision Measurement: Provides high-accuracy voltage and current measurements, suitable for low-current and high-impedance testing.
▪Multi-Functional Integration: Combines voltage source, current source, voltmeter, and ammeter functionalities, supporting multiple testing modes.
▪ Wide Range: Offers a broad voltage and current output range to meet diverse testing needs.
▪ High Resolution: Delivers high-resolution output and measurement, ideal for precision testing.
▪ Four-Quadrant Operation: Supports four-quadrant operation, capable of both sourcing and sinking power to simulate real-world working conditions.
▪ Multiple Interfaces: Equipped with GPIB, USB, LAN, and other interfaces for easy integration and remote control.
▪ User-Friendly Interface: Features an intuitive graphical interface and easy-to-use software, enhancing user experience.
Product Parameters
|
Items |
Parameters |
|
V-Ranges |
300 mV-300 V |
|
I-Ranges |
100 nA-1 A |
|
Accuracy |
0.1% |
|
Power Limits |
DC Mode:max 30W |
|
Over-range Capability |
105% of range, for sourcing and measurement |
|
Sweep Types |
Linear, Log, Custom |
|
Stable Load Capacitance |
<22nF |
|
Wideband Noise |
2mV RMS (typical), <20mV Vp-p (typical) |
|
Cable Guard Voltage |
Output impedance 30KΩ, output voltage offset <80mV |
|
Maximum Sampling Rate |
S series 1000S/s, SXXB series 32000S/s |
|
Programming |
SCPI |
|
Triggering |
Supports IO trigger input and output, trigger polarity configurable |
|
Output Interface |
Front/Rear Banana Jacks |
|
Communication Port |
RS-232, GPIB, Ethernet |
|
Power Supply |
AC 100~240V 50/60Hz |
|
Operating Environment |
25±10℃ |
|
Dimensions (LWH) |
425mm × 255mm × 106mm |
|
Weight |
5Kg |
|
Warranty Period |
1 year |
Applications
▪ Semiconductor Testing: Used for characterizing devices such as diodes, transistors, and MOSFETs.
▪ Material Research: Applied in the study of electrical properties of new materials.
▪ Electronic Component Testing: Used for testing components like resistors, capacitors, and inductors.
▪ Research and Education: Suitable for scientific research experiments and educational demonstrations.
▪ Automated Testing Systems: Can be integrated into automated testing systems to improve testing efficiency.
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|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | S300 |
| MOQ: | 1 unit |
| Packaging Details: | Carton. |
| Payment Terms: | T/T |
S300 DC SMU Source Measure Unit 300V 1A For Electrical Characteristic Testing
The S300 Source Measure Unit, developed by PRECISE INSTRUMENT over many years, is a high-precision, wide dynamic range, and digitally interactive domestically produced source meter. It integrates multiple functions such as voltage and current input/output and measurement. With a maximum output voltage of 300V, a maximum output current of 1A, and a minimum test current resolution of 10pA, it supports four-quadrant operation, making it widely applicable for various electrical characteristic testing and analysis, including semiconductor ICs, components, power devices, sensors, organic materials, and nanomaterials.
Product Features
▪ High-Precision Measurement: Provides high-accuracy voltage and current measurements, suitable for low-current and high-impedance testing.
▪Multi-Functional Integration: Combines voltage source, current source, voltmeter, and ammeter functionalities, supporting multiple testing modes.
▪ Wide Range: Offers a broad voltage and current output range to meet diverse testing needs.
▪ High Resolution: Delivers high-resolution output and measurement, ideal for precision testing.
▪ Four-Quadrant Operation: Supports four-quadrant operation, capable of both sourcing and sinking power to simulate real-world working conditions.
▪ Multiple Interfaces: Equipped with GPIB, USB, LAN, and other interfaces for easy integration and remote control.
▪ User-Friendly Interface: Features an intuitive graphical interface and easy-to-use software, enhancing user experience.
Product Parameters
|
Items |
Parameters |
|
V-Ranges |
300 mV-300 V |
|
I-Ranges |
100 nA-1 A |
|
Accuracy |
0.1% |
|
Power Limits |
DC Mode:max 30W |
|
Over-range Capability |
105% of range, for sourcing and measurement |
|
Sweep Types |
Linear, Log, Custom |
|
Stable Load Capacitance |
<22nF |
|
Wideband Noise |
2mV RMS (typical), <20mV Vp-p (typical) |
|
Cable Guard Voltage |
Output impedance 30KΩ, output voltage offset <80mV |
|
Maximum Sampling Rate |
S series 1000S/s, SXXB series 32000S/s |
|
Programming |
SCPI |
|
Triggering |
Supports IO trigger input and output, trigger polarity configurable |
|
Output Interface |
Front/Rear Banana Jacks |
|
Communication Port |
RS-232, GPIB, Ethernet |
|
Power Supply |
AC 100~240V 50/60Hz |
|
Operating Environment |
25±10℃ |
|
Dimensions (LWH) |
425mm × 255mm × 106mm |
|
Weight |
5Kg |
|
Warranty Period |
1 year |
Applications
▪ Semiconductor Testing: Used for characterizing devices such as diodes, transistors, and MOSFETs.
▪ Material Research: Applied in the study of electrical properties of new materials.
▪ Electronic Component Testing: Used for testing components like resistors, capacitors, and inductors.
▪ Research and Education: Suitable for scientific research experiments and educational demonstrations.
▪ Automated Testing Systems: Can be integrated into automated testing systems to improve testing efficiency.
Video
Video
Video
