Wuhan Precise Instrument Co., Ltd.
quality Source Measure Unit, Dual Channel Source Meter manufacturer from China
All Videos
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00:34
![LDBI Multi-Channel High-Power Laser Aging System]()
LDBI Multi-Channel High-Power Laser Aging System
February 26, 2025 -
00:24
![1000A Current Sensor Test System CTMS]()
1000A Current Sensor Test System CTMS
February 26, 2025 -
00:30
![10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors]()
10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors
February 26, 2025 -
00:36
![1200V/100A Semiconductor Parameter Analyzer SPA6100]()
1200V/100A Semiconductor Parameter Analyzer SPA6100
February 26, 2025 -
00:27
![2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed]()
2 MS/s Multi-channel Data Acquisition Card A400B Board High Speed
February 26, 2025 -
00:24
![A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate]()
A400 Data Acquisition Card with 16-bit ADC Resolution and 1MS/s Sampling Rate
February 26, 2025 -
00:24
![60A CW/600A QCW High Power Testing Laser Power Supply HCPL060]()
60A CW/600A QCW High Power Testing Laser Power Supply HCPL060
February 25, 2025 -
00:24
![60A CW/60A QCW High Power Testing Laser Power Supply HCPL006]()
60A CW/60A QCW High Power Testing Laser Power Supply HCPL006
February 25, 2025 -
00:24
![20A CW/20A QCW High Power Testing Laser Power Supply HCPL002]()
20A CW/20A QCW High Power Testing Laser Power Supply HCPL002
February 25, 2025 -
00:27
![8000V/40mA High Voltage Power Source E800]()
8000V/40mA High Voltage Power Source E800
February 25, 2025 -
00:24
![300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test]()
300A/30V High Current Pulse Power Supply HCPL030 For SiC/IGBT/GaN HEMT Test
February 25, 2025 -
00:24
![3500V/100mA High Voltage Power Source E300]()
3500V/100mA High Voltage Power Source E300
February 25, 2025 -
00:27
![2200V/100mA High Voltage Power Source E200]()
2200V/100mA High Voltage Power Source E200
February 25, 2025 -
00:24
![1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test]()
1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test
February 25, 2025 -
00:24
![1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test]()
1000A/18V High Current Pulse Power Supply HCPL100 For SiC/IGBT/GaN HEMT Test
February 25, 2025 -
00:24
![S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing]()
S300 DC Source Measure Unit 300V/1A for Electrical Characteristic Testing
February 24, 2025 -
00:24
![300V/3A Semiconductor Testing DC Source Measure Unit S300B]()
300V/3A Semiconductor Testing DC Source Measure Unit S300B
February 24, 2025 -
00:24
![30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100]()
30V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P100
February 24, 2025 -
00:24
![100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors]()
100V/1A/10A Pulse Source Meter P200 for Characterizing Semiconductors
February 24, 2025 -
00:24
![300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300]()
300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300
February 24, 2025 -
00:24
![300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials]()
300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials
February 24, 2025 -
00:24
![High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V]()
High Current Pulse Source Measure Unit HCP100 with Max Pulse Output Current 30A and Max Output Voltage 50V
February 24, 2025 -
00:25
![100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT]()
100V/100A High Current Pulse Source Measure Unit HCP300 for IGBT
February 24, 2025 -
00:24
![300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests]()
300V/30A Dual Channel Source Meter DP300B for Various Electrical Characteristic Tests
February 24, 2025 -
00:24
![100V/30A Dual Channel Source Meter DP200B for BJT Test]()
100V/30A Dual Channel Source Meter DP200B for BJT Test
February 24, 2025 -
00:24
![30V/30A Dual Channel Source Meter DP100B with Voltage/Current Measurement and Four Quadrant Operation]()
30V/30A Dual Channel Source Meter DP100B with Voltage/Current Measurement and Four Quadrant Operation
February 24, 2025 -
00:26
![10V/500mA Four-channel Sub Card DC Source Measure Unit CS401]()
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
February 24, 2025 -
00:24
![10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401]()
10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401
February 24, 2025 -
00:24
![10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402]()
10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402
February 24, 2025 -
00:28
![18V/1A Four-channel Sub Card Pulse Source Measure Unit CBI403]()
18V/1A Four-channel Sub Card Pulse Source Measure Unit CBI403
February 24, 2025 -
00:28
![3-Slots Sub Cards Plug-in Source Measure Unit 1003C with Industrial-Grade Reliability and Scalability]()
3-Slots Sub Cards Plug-in Source Measure Unit 1003C with Industrial-Grade Reliability and Scalability
February 24, 2025 -
00:24
![30V/1A Single-channel Sub Card DC Source Measure Unit CS100]()
30V/1A Single-channel Sub Card DC Source Measure Unit CS100
February 24, 2025 -
00:24
![100V/1A Single-channel Sub Card DC Source Measure Unit CS200]()
100V/1A Single-channel Sub Card DC Source Measure Unit CS200
February 24, 2025 -
00:24
![300V/1A Single-channel Sub Card DC Source Measure Unit CS300]()
300V/1A Single-channel Sub Card DC Source Measure Unit CS300
February 24, 2025 -
00:27
![18V/1A Four-channel Sub Card Source DC Measure Unit CS402]()
18V/1A Four-channel Sub Card Source DC Measure Unit CS402
February 24, 2025 -
00:27
![10V/500mA Four-channel Sub Card DC Source Measure Unit CS401]()
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
February 24, 2025 -
00:29
![10V/200mA Four-channel Sub Card Source Meter CS400 for High-Throughput Testing in Parallel Environments]()
10V/200mA Four-channel Sub Card Source Meter CS400 for High-Throughput Testing in Parallel Environments
February 24, 2025 -
00:36
![30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100]()
30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100
February 24, 2025 -
01:24
![PRECISE Instrument | Source of Exploration Internal and External Consistency]()
PRECISE Instrument | Source of Exploration Internal and External Consistency
February 17, 2025
