30V 4A 30A Pulse Source Measure Unit P100B Sourcemeter For Semiconductor Devices    

      The P100B Benchtop Pulse SourceMeter is a future-oriented high-performance test instrument designed to integrate advanced digital signal processing, intelligent control, and human-machine interaction technologies. It combines high-precision measurement, large dynamic-range output, and user-friendly digital touch operation. With a 5-inch touchscreen interface as intuitive as a smartphone, the P100B delivers a maximum output voltage of 30V and a pulsed current of 30A, supporting four-quadrant operation. Whether testing tiny electronic components or high-power devices, the P100B excels as a versatile tool for characterizing modern semiconductors, nanomaterials, organic electronics, printed electronics, and other low-power, small-scale devices.

Product Features

 Leading-edge Performance with Advanced Technology

▪ Utilizes digital calibration, adaptive filtering, and high-speed data processing to achieve industry-leading precision and dynamic range.

▪ Measures ultra-low currents down to 1pA for low-power devices and delivers stable 30A pulsed outputs for high-power components.

▪ Intelligent algorithms ensure precise control and minimized errors throughout testing processes.

Intuitive Smart Interaction

▪ 5-inch touchscreen with a fully graphical interface supports voice commands for rapid setup and data queries.

▪ Customizable interface layouts and shortcuts adapt to user habits, reducing learning curves and boosting efficiency.

High-Precision Pulse Control & Innovative Applications

▪ Achieves a minimum pulse width of 200μs with advanced circuitry for stable amplitude and timing.

▪ Supports PWM (Pulse Width Modulation), PFM (Pulse Frequency Modulation), and custom modulation modes for wireless communications, radar systems, and other cutting-edge applications.

Adaptive Four-Quadrant Operation

▪ Simulates real-world electrical conditions, including bidirectional current sourcing/sinking (source/sink modes).

Innovative Scanning Modes & Deep Data Analysis

▪ Dynamic Sweep Mode: Automatically adjusts scan parameters based on real-time data for adaptive testing.

▪ Correlated Sweep Mode: Enables multi-parameter joint testing to uncover hidden data relationships.

▪ Built-in AI analytics engine generates predictive insights and professional reports.

Efficient Data Management

▪ USB storage and one-click report generation streamline data sharing.

▪ Classifies, archives, retrieves, and backs up test data for easy management.

▪ Remote data transmission and sharing via network interfaces enhance team collaboration.

Open Connectivity & Ecosystem Integration

▪ Equipped with RS-232, GPIB, and LAN interfaces for seamless integration with automated test systems (ATE) and third-party software.

· Collaborates with industry partners to advance measurement technologies and applications.

Product Parameters

Applications

Semiconductor Technology Innovation

▪ Tests 2D materials, quantum dots, and advanced-node ICs for leakage current, threshold voltage, and process optimization.

▪ Validates SiC/GaN devices under high-voltage/high-temperature conditions to accelerate next-gen power electronics.

Energy & Power Systems:Measures perovskite/organic solar cell efficiency and solid-state/sodium-ion battery charge/discharge cycles.

Sensor :The electrical performance of resistive sensors

Advanced Materials Research

▪ Analyzes nanocomposites, organic semiconductors, and superconductors for electrical, optical, and multi-physics properties.

▪ Drives breakthroughs in flexible electronics, wearables, and energy storage technologies.