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Source Measure Unit
Created with Pixso. Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

Brand Name: PRECISE INSTRUMENT
Model Number: P200B
MOQ: 1 unit
Delivery Time: 2-8 weeks
Payment Terms: T/T
Detail Information
Place of Origin:
China
V-Ranges:
300mV-100V
I-Ranges:
Pulse Mode: 10nA–30A DC Mode: 10nA–4A
Power Limits:
DC Mode:Max 40W /Pulse Mode: Max 400W
Minimum Pulse Width:
200μs
Sampling Rate:
100,000 S/s
Accuracy:
0.1%/0.03%
Packaging Details:
Carton.
Supply Ability:
500 Set/Month
Highlight:

Semiconductor Testing Pulse SMU Unit

,

P200B Source Measure Unit

,

100V 4A 30A SMU Unit

Product Description

Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

     The P200B Benchtop Pulse SourceMeter is a user-centric, high-performance test instrument featuring a 5-inch touchscreen and intuitive graphical interface for effortless operation. With a maximum output of 100V and 30A pulsed current, it supports four-quadrant operation, excelling in testing low-power sensors, high-voltage power modules, semiconductors, nanomaterials, and printed electronics.


Product Features

▪  Easy Operation: 5-inch touchscreen with guided tutorials simplifies setup, even for beginners.

▪  Wide Dynamic Range: 1pA–30A (pulse mode), 1pA–4A (DC mode), and 0–100V voltage output with auto-ranging.

Precision Pulse Control: 200μs minimum pulse width ensures stable amplitude, frequency, and timing for high-speed device testing.

High Accuracy: 0.03% accuracy (1μA–1A current, full voltage range) and 0.1% accuracy for extended ranges.

Four-Quadrant Flexibility: Simulates energy recovery, bidirectional current flow, and real-world electrical conditions.

Customizable Scans: Linear, logarithmic, and user-defined sweep modes for I-V characterization and material studies.

▪ Data Management: One-click USB storage, automated reports, and real-time data sharing via RS-232/GPIB/LAN interfaces.


Product Parameters

Items

Parameters

V-Ranges

300 mV-100V

I-Ranges

Pulse Mode: 10nA–30A DC Mode: 10nA–4A

Power Limits

DC Mode:Max 40W /Pulse Mode: Max 400W

Minimum Pulse Width

200μs

Sampling Rate

100,000 S/s

Accuracy

0.1%/0.03%

Triggering:

I/O trigger polarity

Display

5-inch touchscreen

Interfaces

RS-232, GPIB, LAN

Storage

USB support

Power Supply

100–240V AC, 50/60Hz


Applications

▪ Semiconductors: Diode leakage tests, MOSFET switching analysis, SiC/GaN high-temperature validation.

▪ Energy & Displays: LED/AMOLED efficiency optimization, solar cell/battery performance testing.

▪ Sensors: Temperature/pressure sensor calibration, anti-interference validation.

▪ Materials Science: Graphene/nanowire conductivity studies, e-ink characterization for flexible electronics.




Good price  online

Products Details

Created with Pixso. Home Created with Pixso. Products Created with Pixso.
Source Measure Unit
Created with Pixso. Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

Brand Name: PRECISE INSTRUMENT
Model Number: P200B
MOQ: 1 unit
Packaging Details: Carton.
Payment Terms: T/T
Detail Information
Place of Origin:
China
Brand Name:
PRECISE INSTRUMENT
Model Number:
P200B
V-Ranges:
300mV-100V
I-Ranges:
Pulse Mode: 10nA–30A DC Mode: 10nA–4A
Power Limits:
DC Mode:Max 40W /Pulse Mode: Max 400W
Minimum Pulse Width:
200μs
Sampling Rate:
100,000 S/s
Accuracy:
0.1%/0.03%
Minimum Order Quantity:
1 unit
Packaging Details:
Carton.
Delivery Time:
2-8 weeks
Payment Terms:
T/T
Supply Ability:
500 Set/Month
Highlight:

Semiconductor Testing Pulse SMU Unit

,

P200B Source Measure Unit

,

100V 4A 30A SMU Unit

Product Description

Semiconductor Testing Pulse SMU Unit Source Measure Unit P200B 100V 4A 30A

     The P200B Benchtop Pulse SourceMeter is a user-centric, high-performance test instrument featuring a 5-inch touchscreen and intuitive graphical interface for effortless operation. With a maximum output of 100V and 30A pulsed current, it supports four-quadrant operation, excelling in testing low-power sensors, high-voltage power modules, semiconductors, nanomaterials, and printed electronics.


Product Features

▪  Easy Operation: 5-inch touchscreen with guided tutorials simplifies setup, even for beginners.

▪  Wide Dynamic Range: 1pA–30A (pulse mode), 1pA–4A (DC mode), and 0–100V voltage output with auto-ranging.

Precision Pulse Control: 200μs minimum pulse width ensures stable amplitude, frequency, and timing for high-speed device testing.

High Accuracy: 0.03% accuracy (1μA–1A current, full voltage range) and 0.1% accuracy for extended ranges.

Four-Quadrant Flexibility: Simulates energy recovery, bidirectional current flow, and real-world electrical conditions.

Customizable Scans: Linear, logarithmic, and user-defined sweep modes for I-V characterization and material studies.

▪ Data Management: One-click USB storage, automated reports, and real-time data sharing via RS-232/GPIB/LAN interfaces.


Product Parameters

Items

Parameters

V-Ranges

300 mV-100V

I-Ranges

Pulse Mode: 10nA–30A DC Mode: 10nA–4A

Power Limits

DC Mode:Max 40W /Pulse Mode: Max 400W

Minimum Pulse Width

200μs

Sampling Rate

100,000 S/s

Accuracy

0.1%/0.03%

Triggering:

I/O trigger polarity

Display

5-inch touchscreen

Interfaces

RS-232, GPIB, LAN

Storage

USB support

Power Supply

100–240V AC, 50/60Hz


Applications

▪ Semiconductors: Diode leakage tests, MOSFET switching analysis, SiC/GaN high-temperature validation.

▪ Energy & Displays: LED/AMOLED efficiency optimization, solar cell/battery performance testing.

▪ Sensors: Temperature/pressure sensor calibration, anti-interference validation.

▪ Materials Science: Graphene/nanowire conductivity studies, e-ink characterization for flexible electronics.