1200V/100A Semiconductor Parameter Analyzer SPA6100 Semiconductor Test Systems

     The SPA6100 Semiconductor Parameter Analyzer offers advantages including high precision, wide measurement range, rapid flexibility, and strong compatibility. This product supports simultaneous testing of DC current-voltage (I-V), capacitance-voltage (C-V), and pulsed I-V characteristics under high-current/high-voltage conditions.

      Featuring a modular structural design, it allows users to flexibly select and configure measurement units for system upgrades based on testing requirements. The analyzer supports measurements up to 1200V voltage, 100A high current, and 1pA low-current resolution, while also enabling multi-frequency AC capacitance measurements within the 10kHz to 1MHz range.

      Equipped with dedicated semiconductor parameter testing software, it supports both interactive manual operation and automated operation integrated with probe stations. The system streamlines the entire workflow from measurement setup, execution, result analysis to data management, enabling efficient and repeatable device characterization. Additionally, it is compatible with temperature chambers and thermal control modules to meet high/low-temperature testing requirements.

Product Features

▪ 30μV to 1200V, 1pA to 100A wide-range measurement capability
▪ High measurement accuracy, achieving up to 0.03% across the full measurement range
▪ Built-in standard device test programs for direct invocation and simplified testing
▪ Automatic real-time parameter extraction, data plotting, and analysis functions
▪ Fast switching between C-V and I-V measurements without requiring rewiring
▪ Flexible fixture customization solutions with strong compatibility
▪ Free PC-based software and SCPI command set provided

Product Parameters

Applications

▪ Nanomaterials: Resistivity, Carrier Mobility, Carrier Concentration, Hall Voltage

▪Flexible Materials:Tensile/Torsional/Bending Test, Voltage-Time (V-t), Current-Time (I-t), Resistance-Time (R-t), Resistivity, Sensitivity

▪ IC Chips: Open/Short(O/S) Test, Input High/Low Current (IIH/IIL), Output High/Low Voltage (VOH/VOL), I/O Pin I-V Curves

▪Discrete Devices:BVDSS,IGSS,IDSS,Vgs(th),Rdson,Ciss/Coss/Crss (Input/Output/Reverse Transfer Capacitance),Output/Transfer/C-V Curves.

▪ Photodetectors: Dark Current (ID), Junction Capacitance (Ct), Reverse Breakdown Voltage (VBR), Responsivity (R).

▪ Perovskite Solar Cells:Open-Circuit Voltage (VOC), Short-Circuit Current (ISC),Maximum Power (Pmax), Max Power Voltage (Vmax), Max Power Current (Imax),Fill Factor (FF), Efficiency (η), Series Resistance (Rs), Shunt Resistance (Rsh)

▪ LDs/LEDs/OLEDs:Operating Current (Iop), Optical Power (Popt), Forward Voltage (VF),Threshold Current (Ith), Reverse Voltage (VR), Reverse Current (IR),Light-Current-Voltage (LIV) and I-V-Luminance (IVL) Curves

▪  Sensors/Memristors:Voltage-Time (V-t), Current-Time (I-t), Resistance-Time (R-t),DC/Pulse/AC I-V Testing