|
|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CS1003C |
| MOQ: | 1 unit |
| Delivery Time: | 2-8 weeks |
| Payment Terms: | T/T |
3 Slots Sub Card Plug In SMU Unit 1003C Source Measurement Unit
The 1003C modular chassis is a professional-grade testing solution engineered for high-performance applications. Combining modular scalability with industrial-grade reliability, it serves as a critical testing infrastructure in scientific research and industrial validation scenarios. This platform delivers efficient, plug-and-play operation for multi-domain testing tasks through its configurable architecture.
Product Features
▪ Modular Expansion: Multi-subcard slots enable on-demand functional module combinations.
▪ Industrial Reliability: Multi-layer EMI shielding and intelligent thermal management ensure stable operation in harsh environments (-40°C to 85°C).
▪ High-Speed Interconnect: Integrated GPIB/Ethernet/USB interfaces achieve <1ms data synchronization latency.
▪Seamless Compatibility: Plug-and-play integration with Pusces CS/CBI series subcards for rapid test-loop configuration.
▪ Precision Synchronization: 3Gbps backplane bandwidth and 16-channel trigger bus deliver μs-level multi-channel timing accuracy.
Product Parameters
|
Items |
Parameters |
|
Number of Slots |
3 channels |
|
Communication Interfaces |
DC Mode:10nA–4A/Pulse Mode:10nA–30A |
|
Power Supply Specifications |
DC Mode:max 40W/Pulse Mode:max 400W |
|
Operating Environment Temperature |
25±10℃ |
|
Dimensions (Length * Width * Height) |
552mm×482mm×178mm |
Applications
▪ Discrete semiconductor device characteristics test,including resistors, diodes,light-emitting diodes,Zener diodes,PIN diodes,BJT transistors,MOSFETs,SIC,GaN and other devices.
▪ Energy and efficiency tests,including LED/AMOLED,solar cells,DC-DC converters,etc.
▪ Sensor characteristic test,including resistivity,Hall effect,etc.
▪ Organic materials characteristic test,including electronic ink,printed electronic technology,etc.
▪ Nanomaterials characteristics test,including graphene,nanowires,etc.
Video
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|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CS1003C |
| MOQ: | 1 unit |
| Packaging Details: | Carton. |
| Payment Terms: | T/T |
3 Slots Sub Card Plug In SMU Unit 1003C Source Measurement Unit
The 1003C modular chassis is a professional-grade testing solution engineered for high-performance applications. Combining modular scalability with industrial-grade reliability, it serves as a critical testing infrastructure in scientific research and industrial validation scenarios. This platform delivers efficient, plug-and-play operation for multi-domain testing tasks through its configurable architecture.
Product Features
▪ Modular Expansion: Multi-subcard slots enable on-demand functional module combinations.
▪ Industrial Reliability: Multi-layer EMI shielding and intelligent thermal management ensure stable operation in harsh environments (-40°C to 85°C).
▪ High-Speed Interconnect: Integrated GPIB/Ethernet/USB interfaces achieve <1ms data synchronization latency.
▪Seamless Compatibility: Plug-and-play integration with Pusces CS/CBI series subcards for rapid test-loop configuration.
▪ Precision Synchronization: 3Gbps backplane bandwidth and 16-channel trigger bus deliver μs-level multi-channel timing accuracy.
Product Parameters
|
Items |
Parameters |
|
Number of Slots |
3 channels |
|
Communication Interfaces |
DC Mode:10nA–4A/Pulse Mode:10nA–30A |
|
Power Supply Specifications |
DC Mode:max 40W/Pulse Mode:max 400W |
|
Operating Environment Temperature |
25±10℃ |
|
Dimensions (Length * Width * Height) |
552mm×482mm×178mm |
Applications
▪ Discrete semiconductor device characteristics test,including resistors, diodes,light-emitting diodes,Zener diodes,PIN diodes,BJT transistors,MOSFETs,SIC,GaN and other devices.
▪ Energy and efficiency tests,including LED/AMOLED,solar cells,DC-DC converters,etc.
▪ Sensor characteristic test,including resistivity,Hall effect,etc.
▪ Organic materials characteristic test,including electronic ink,printed electronic technology,etc.
▪ Nanomaterials characteristics test,including graphene,nanowires,etc.
Video
Video
Video
Video
Video
Video
Video
