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| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CS100 |
| MOQ: | 1 unit |
| Delivery Time: | 2-8 weeks |
| Payment Terms: | T/T |
Single Channel PXI SMU 30V 1A Sub Card DC Source Measurement Unit CS100
The CS100 modular subcard is a high-performance testing module designed for integration with modular chassis systems. Delivering exceptional precision and versatility, it provides efficient solutions for complex testing scenarios. As a core component of the testing ecosystem, the CS100 subcard synergizes with the main chassis to adapt to diverse industry requirements, from semiconductor validation to industrial automation.
Product Features
▪ High-precision Measurement: Achieves 0.1% accuracy across full measurement ranges.
▪ Rapid Response: 1 kS/s sampling rate ensures real-time data acquisition and processing.
▪ Flexible Configuration: Seamlessly integrates with other subcards for customized test setups.
▪ Trigger Customization: Flexible channel-trigger bus configuration enables multi-test function combinations.
▪ Easy Integration: Compact design compatible with standard 19-inch racks for streamlined deployment.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
1 channels |
|
Voltage Range |
300mV~30V |
|
Minimum Voltage Resolution |
30uV |
|
Current Range |
100nA～1A |
|
Minimum Current Resolution |
10pA |
|
Maximum Continuous Wave (CW) Output Power |
30W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Testing:Supports electrical parameter testing (e.g., on-resistance, leakage current) for chips and transistors, enabling quality control and performance optimization in R&D and production.
▪ New Energy Battery Testing:Evaluates lithium-ion/solar battery performance metrics like charge-discharge cycles, capacity, and internal resistance to accelerate energy storage technology development.
▪ Electronic Component Validation:Precision measurement of passive components (resistors, capacitors, inductors) to ensure compliance with industrial reliability standards.
▪ Academic Research:Serves as a modular test platform for universities and labs in electrical engineering and materials science, enabling cutting-edge experiments in MEMS, flexible electronics, and more.
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|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CS100 |
| MOQ: | 1 unit |
| Packaging Details: | Carton. |
| Payment Terms: | T/T |
Single Channel PXI SMU 30V 1A Sub Card DC Source Measurement Unit CS100
The CS100 modular subcard is a high-performance testing module designed for integration with modular chassis systems. Delivering exceptional precision and versatility, it provides efficient solutions for complex testing scenarios. As a core component of the testing ecosystem, the CS100 subcard synergizes with the main chassis to adapt to diverse industry requirements, from semiconductor validation to industrial automation.
Product Features
▪ High-precision Measurement: Achieves 0.1% accuracy across full measurement ranges.
▪ Rapid Response: 1 kS/s sampling rate ensures real-time data acquisition and processing.
▪ Flexible Configuration: Seamlessly integrates with other subcards for customized test setups.
▪ Trigger Customization: Flexible channel-trigger bus configuration enables multi-test function combinations.
▪ Easy Integration: Compact design compatible with standard 19-inch racks for streamlined deployment.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
1 channels |
|
Voltage Range |
300mV~30V |
|
Minimum Voltage Resolution |
30uV |
|
Current Range |
100nA～1A |
|
Minimum Current Resolution |
10pA |
|
Maximum Continuous Wave (CW) Output Power |
30W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Testing:Supports electrical parameter testing (e.g., on-resistance, leakage current) for chips and transistors, enabling quality control and performance optimization in R&D and production.
▪ New Energy Battery Testing:Evaluates lithium-ion/solar battery performance metrics like charge-discharge cycles, capacity, and internal resistance to accelerate energy storage technology development.
▪ Electronic Component Validation:Precision measurement of passive components (resistors, capacitors, inductors) to ensure compliance with industrial reliability standards.
▪ Academic Research:Serves as a modular test platform for universities and labs in electrical engineering and materials science, enabling cutting-edge experiments in MEMS, flexible electronics, and more.
Video
Video
Video
Video
Video
Video
Video
