| 
                                         | 
                
| Brand Name: | PRECISE INSTRUMENT | 
| Model Number: | CS200 | 
| MOQ: | 1 unit | 
| Delivery Time: | 2-8 weeks | 
| Payment Terms: | T/T | 
100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200
The CS200 modular subcard is a high-precision, single-channel digital Source-Measure Unit (SMU) designed for multi-slot modular host systems. As a core component of the CS Series, this subcard integrates voltage/current sourcing, voltmeter/ammeter functions, and electronic load capabilities into a single module. Supporting four-quadrant operation (sourcing/sinking modes), it enables simultaneous current/voltage sourcing and measurement, making it ideal for complex electrical characterization tasks such as semiconductor parametric analysis and power device validation.
Product Features
▪ Precision: 0.1% source/measurement accuracy with 5½-digit resolution.
▪ Ranges: Voltage 300 mV–100 V, current 100 nA–1 A, max power 30 W.
▪ Operational Modes: Four-quadrant operation for both sourcing and electronic loading.
▪ Scalability: Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts.
▪ Multi-channel Control: Trigger bus enables synchronized scanning or independent operation across subcards.
▪ Scan Modes: Linear, exponential, and custom IV curve scanning for complex characterization.
▪ Interfaces: RS-232, GPIB, and Ethernet for seamless integration into automated test systems.
Product Parameters
| 
 Items  | 
 Parameters  | 
| 
 Number of Channels  | 
 1 channels  | 
| 
 Voltage Range  | 
 300mV~100V  | 
| 
 Minimum Voltage Resolution  | 
 30uV  | 
| 
 Current Range  | 
 100nA~1A  | 
| 
 Minimum Current Resolution  | 
 10pA  | 
| 
 Maximum Continuous Wave (CW) Output Power  | 
 30W, 4-quadrant source or sink mode  | 
| 
 Voltage Source Limits  | 
 ±30V (for the range ≤1A), ±100V (for the range ≤100mA)  | 
| 
 Current Source Limits  | 
 ±1A (for the range ≤30V), ±100mA (for the range ≤100V)  | 
| 
 Stable Load Capacitance  | 
 <22nF  | 
| 
 Broadband Noise (20MHz)  | 
 2mV RMS (typical value), <20mV Vp-p (typical value)  | 
| 
 Maximum Sampling Rate  | 
 1000 S/s  | 
| 
 Source Measurement Accuracy  | 
 0.10%  | 
| 
 Hosts it is Compatible with  | 
 1003C,1010C  | 
Applications
▪ Semiconductor Device Testing:IV characterization and parametric analysis of discrete devices (diodes, BJTs, MOSFETs, SiC devices).
▪ Sensor evaluation, including resistivity measurement and Hall effect analysis.Advanced Materials & Energy ▪ Technologies:Electrical property characterization of nanomaterials (graphene, nanowires) and organic materials (e-ink).Efficiency evaluation and aging assessment for solar cells, LEDs, and AMOLEDs.
▪ Industrial & Research Applications:Multi-channel parallel test systems for battery cycle testing and DC-DC converter efficiency validation.High-density testing solutions (e.g., wafer-level testing) via multi-subcard collaboration to enhance throughput.
                                         
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                    | Brand Name: | PRECISE INSTRUMENT | 
| Model Number: | CS200 | 
| MOQ: | 1 unit | 
| Packaging Details: | Carton. | 
| Payment Terms: | T/T | 
100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200
The CS200 modular subcard is a high-precision, single-channel digital Source-Measure Unit (SMU) designed for multi-slot modular host systems. As a core component of the CS Series, this subcard integrates voltage/current sourcing, voltmeter/ammeter functions, and electronic load capabilities into a single module. Supporting four-quadrant operation (sourcing/sinking modes), it enables simultaneous current/voltage sourcing and measurement, making it ideal for complex electrical characterization tasks such as semiconductor parametric analysis and power device validation.
Product Features
▪ Precision: 0.1% source/measurement accuracy with 5½-digit resolution.
▪ Ranges: Voltage 300 mV–100 V, current 100 nA–1 A, max power 30 W.
▪ Operational Modes: Four-quadrant operation for both sourcing and electronic loading.
▪ Scalability: Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts.
▪ Multi-channel Control: Trigger bus enables synchronized scanning or independent operation across subcards.
▪ Scan Modes: Linear, exponential, and custom IV curve scanning for complex characterization.
▪ Interfaces: RS-232, GPIB, and Ethernet for seamless integration into automated test systems.
Product Parameters
| 
 Items  | 
 Parameters  | 
| 
 Number of Channels  | 
 1 channels  | 
| 
 Voltage Range  | 
 300mV~100V  | 
| 
 Minimum Voltage Resolution  | 
 30uV  | 
| 
 Current Range  | 
 100nA~1A  | 
| 
 Minimum Current Resolution  | 
 10pA  | 
| 
 Maximum Continuous Wave (CW) Output Power  | 
 30W, 4-quadrant source or sink mode  | 
| 
 Voltage Source Limits  | 
 ±30V (for the range ≤1A), ±100V (for the range ≤100mA)  | 
| 
 Current Source Limits  | 
 ±1A (for the range ≤30V), ±100mA (for the range ≤100V)  | 
| 
 Stable Load Capacitance  | 
 <22nF  | 
| 
 Broadband Noise (20MHz)  | 
 2mV RMS (typical value), <20mV Vp-p (typical value)  | 
| 
 Maximum Sampling Rate  | 
 1000 S/s  | 
| 
 Source Measurement Accuracy  | 
 0.10%  | 
| 
 Hosts it is Compatible with  | 
 1003C,1010C  | 
Applications
▪ Semiconductor Device Testing:IV characterization and parametric analysis of discrete devices (diodes, BJTs, MOSFETs, SiC devices).
▪ Sensor evaluation, including resistivity measurement and Hall effect analysis.Advanced Materials & Energy ▪ Technologies:Electrical property characterization of nanomaterials (graphene, nanowires) and organic materials (e-ink).Efficiency evaluation and aging assessment for solar cells, LEDs, and AMOLEDs.
▪ Industrial & Research Applications:Multi-channel parallel test systems for battery cycle testing and DC-DC converter efficiency validation.High-density testing solutions (e.g., wafer-level testing) via multi-subcard collaboration to enhance throughput.