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Multi Channel Test Equipment
Created with Pixso. 100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200

100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200

Brand Name: PRECISE INSTRUMENT
Model Number: CS200
MOQ: 1 unit
Delivery Time: 2-8 weeks
Payment Terms: T/T
Detail Information
Place of Origin:
China
Number Of Channels:
1 Channels
Voltage Range:
300mV~100V
Current Range:
100nA~1A
Maximum Sampling Rate:
1000 S/s
Maximum Output Power:
30W(DC)
Packaging Details:
Carton.
Supply Ability:
500 Set/Month
Highlight:

100V 1A PXI Source Measure Unit 

,

Single Channel PXI Source Measure Unit

,

Sub Card DC SMU Unit

Product Description

100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200

      The CS200 modular subcard is a high-precision, single-channel digital Source-Measure Unit (SMU) designed for multi-slot modular host systems. As a core component of the CS Series, this subcard integrates voltage/current sourcing, voltmeter/ammeter functions, and electronic load capabilities into a single module. Supporting four-quadrant operation (sourcing/sinking modes), it enables simultaneous current/voltage sourcing and measurement, making it ideal for complex electrical characterization tasks such as semiconductor parametric analysis and power device validation.

 

Product Features

▪ Precision: 0.1% source/measurement accuracy with 5½-digit resolution.

▪ Ranges: Voltage 300 mV–100 V, current 100 nA–1 A, max power 30 W.

▪ Operational Modes: Four-quadrant operation for both sourcing and electronic loading.

▪ Scalability: Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts.

▪ Multi-channel Control: Trigger bus enables synchronized scanning or independent operation across subcards.

▪ Scan Modes: Linear, exponential, and custom IV curve scanning for complex characterization.

▪ Interfaces: RS-232, GPIB, and Ethernet for seamless integration into automated test systems.

 

Product Parameters

Items

Parameters

Number of Channels

1 channels

Voltage Range

300mV~100V

Minimum Voltage Resolution

30uV

Current Range

100nA1A

Minimum Current Resolution

10pA

Maximum Continuous Wave (CW) Output Power

30W, 4-quadrant source or sink mode

Voltage Source Limits

±30V (for the range ≤1A), ±100V (for the range ≤100mA)

Current Source Limits

±1A (for the range ≤30V), ±100mA (for the range ≤100V)

Stable Load Capacitance

<22nF

Broadband Noise (20MHz)

2mV RMS (typical value), <20mV Vp-p (typical value)

Maximum Sampling Rate

1000 S/s

Source Measurement Accuracy

0.10%

Hosts it is Compatible with

1003C,1010C

 

Applications

▪ Semiconductor Device Testing:IV characterization and parametric analysis of discrete devices (diodes, BJTs, MOSFETs, SiC devices).

▪ Sensor evaluation, including resistivity measurement and Hall effect analysis.Advanced Materials & Energy ▪ Technologies:Electrical property characterization of nanomaterials (graphene, nanowires) and organic materials (e-ink).Efficiency evaluation and aging assessment for solar cells, LEDs, and AMOLEDs.

▪ Industrial & Research Applications:Multi-channel parallel test systems for battery cycle testing and DC-DC converter efficiency validation.High-density testing solutions (e.g., wafer-level testing) via multi-subcard collaboration to enhance throughput.

 


Good price  online

Products Details

Created with Pixso. Home Created with Pixso. Products Created with Pixso.
Multi Channel Test Equipment
Created with Pixso. 100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200

100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200

Brand Name: PRECISE INSTRUMENT
Model Number: CS200
MOQ: 1 unit
Packaging Details: Carton.
Payment Terms: T/T
Detail Information
Place of Origin:
China
Brand Name:
PRECISE INSTRUMENT
Model Number:
CS200
Number Of Channels:
1 Channels
Voltage Range:
300mV~100V
Current Range:
100nA~1A
Maximum Sampling Rate:
1000 S/s
Maximum Output Power:
30W(DC)
Minimum Order Quantity:
1 unit
Packaging Details:
Carton.
Delivery Time:
2-8 weeks
Payment Terms:
T/T
Supply Ability:
500 Set/Month
Highlight:

100V 1A PXI Source Measure Unit 

,

Single Channel PXI Source Measure Unit

,

Sub Card DC SMU Unit

Product Description

100V 1A PXI Source Measure Unit Single Channel Sub Card DC SMU Unit CS200

      The CS200 modular subcard is a high-precision, single-channel digital Source-Measure Unit (SMU) designed for multi-slot modular host systems. As a core component of the CS Series, this subcard integrates voltage/current sourcing, voltmeter/ammeter functions, and electronic load capabilities into a single module. Supporting four-quadrant operation (sourcing/sinking modes), it enables simultaneous current/voltage sourcing and measurement, making it ideal for complex electrical characterization tasks such as semiconductor parametric analysis and power device validation.

 

Product Features

▪ Precision: 0.1% source/measurement accuracy with 5½-digit resolution.

▪ Ranges: Voltage 300 mV–100 V, current 100 nA–1 A, max power 30 W.

▪ Operational Modes: Four-quadrant operation for both sourcing and electronic loading.

▪ Scalability: Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts.

▪ Multi-channel Control: Trigger bus enables synchronized scanning or independent operation across subcards.

▪ Scan Modes: Linear, exponential, and custom IV curve scanning for complex characterization.

▪ Interfaces: RS-232, GPIB, and Ethernet for seamless integration into automated test systems.

 

Product Parameters

Items

Parameters

Number of Channels

1 channels

Voltage Range

300mV~100V

Minimum Voltage Resolution

30uV

Current Range

100nA1A

Minimum Current Resolution

10pA

Maximum Continuous Wave (CW) Output Power

30W, 4-quadrant source or sink mode

Voltage Source Limits

±30V (for the range ≤1A), ±100V (for the range ≤100mA)

Current Source Limits

±1A (for the range ≤30V), ±100mA (for the range ≤100V)

Stable Load Capacitance

<22nF

Broadband Noise (20MHz)

2mV RMS (typical value), <20mV Vp-p (typical value)

Maximum Sampling Rate

1000 S/s

Source Measurement Accuracy

0.10%

Hosts it is Compatible with

1003C,1010C

 

Applications

▪ Semiconductor Device Testing:IV characterization and parametric analysis of discrete devices (diodes, BJTs, MOSFETs, SiC devices).

▪ Sensor evaluation, including resistivity measurement and Hall effect analysis.Advanced Materials & Energy ▪ Technologies:Electrical property characterization of nanomaterials (graphene, nanowires) and organic materials (e-ink).Efficiency evaluation and aging assessment for solar cells, LEDs, and AMOLEDs.

▪ Industrial & Research Applications:Multi-channel parallel test systems for battery cycle testing and DC-DC converter efficiency validation.High-density testing solutions (e.g., wafer-level testing) via multi-subcard collaboration to enhance throughput.