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| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CBI401 |
| MOQ: | 1 unit |
| Delivery Time: | 2-8 weeks |
| Payment Terms: | T/T |
10V 500mA PXI Source Measure Unit Sub Card Pulse PXI SMU Unit CBI401
The CBI401 modular subcard is a core component of the CS Series precision digital Source-Measure Units (SMUs), designed for medium-to-low power multi-channel electrical characterization. Featuring a single-card quad-channel common-ground architecture, each channel operates independently or synchronously, ideal for high-density parallel testing. Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts, it leverages a 3Gbps backplane bandwidth and 16-channel trigger bus to enable high-speed multi-device coordination. Optimized for low-noise, high-stability batch testing, it delivers up to 500mA current, 10V voltage, and 5W power per channel, addressing precision testing needs in semiconductors, sensors, and micro-power devices.
Product Features
▪ High-Density Multi-channel Design:Integrates 4 independent channels per subcard for parallel device testing.
▪ Synchronized Operation:Hardware-triggered synchronization across channels ensures μs-level timing accuracy.
▪ Precision & Low Noise:0.1% sourcing/measurement accuracy with 5½-digit resolution; current measurement down to 5μA, voltage range 10mV–10V.
▪ Four-Quadrant Operation:Simulates power supply or electronic load behavior in sourcing/sinking modes.
▪ Dual Mode Flexibility:Supports both pulsed and DC testing protocols for dynamic characterization.
▪ Scalable Architecture:Seamless integration with CS-series hosts for system expansion up to 40 channels.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
±10V |
|
Minimum Voltage Resolution |
1mV |
|
Current Range |
2mA～500mA |
|
Minimum Current Resolution |
200nA |
|
Minimum Pulse Width |
100μs, maximum duty cycle 100% |
|
Programmable Pulse Width Resolution |
1μs |
|
Maximum Continuous Wave (CW) Output Power |
5W, 4-quadrant source or sink mode |
|
Maximum Pulse (PW) Output Power |
5W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Discrete semiconductor device characteristics test,including resistors, diodes,light-emitting diodes,Zener diodes,PIN diodes,BJT transistors,MOSFETs,SIC,GaN and other devices;
▪ Energy and efficiency tests,including LED/AMOLED,solar cells,DC-DC converters,etc.;
▪ Sensor characteristic test,including resistivity,Hall effect,etc.;
▪ Organic materials characteristic test,including electronic ink,printed electronic technology,etc.;
▪ Nanomaterials characteristics test,including graphene,nanowires,etc.
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|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CBI401 |
| MOQ: | 1 unit |
| Packaging Details: | Carton. |
| Payment Terms: | T/T |
10V 500mA PXI Source Measure Unit Sub Card Pulse PXI SMU Unit CBI401
The CBI401 modular subcard is a core component of the CS Series precision digital Source-Measure Units (SMUs), designed for medium-to-low power multi-channel electrical characterization. Featuring a single-card quad-channel common-ground architecture, each channel operates independently or synchronously, ideal for high-density parallel testing. Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts, it leverages a 3Gbps backplane bandwidth and 16-channel trigger bus to enable high-speed multi-device coordination. Optimized for low-noise, high-stability batch testing, it delivers up to 500mA current, 10V voltage, and 5W power per channel, addressing precision testing needs in semiconductors, sensors, and micro-power devices.
Product Features
▪ High-Density Multi-channel Design:Integrates 4 independent channels per subcard for parallel device testing.
▪ Synchronized Operation:Hardware-triggered synchronization across channels ensures μs-level timing accuracy.
▪ Precision & Low Noise:0.1% sourcing/measurement accuracy with 5½-digit resolution; current measurement down to 5μA, voltage range 10mV–10V.
▪ Four-Quadrant Operation:Simulates power supply or electronic load behavior in sourcing/sinking modes.
▪ Dual Mode Flexibility:Supports both pulsed and DC testing protocols for dynamic characterization.
▪ Scalable Architecture:Seamless integration with CS-series hosts for system expansion up to 40 channels.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
±10V |
|
Minimum Voltage Resolution |
1mV |
|
Current Range |
2mA～500mA |
|
Minimum Current Resolution |
200nA |
|
Minimum Pulse Width |
100μs, maximum duty cycle 100% |
|
Programmable Pulse Width Resolution |
1μs |
|
Maximum Continuous Wave (CW) Output Power |
5W, 4-quadrant source or sink mode |
|
Maximum Pulse (PW) Output Power |
5W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Discrete semiconductor device characteristics test,including resistors, diodes,light-emitting diodes,Zener diodes,PIN diodes,BJT transistors,MOSFETs,SIC,GaN and other devices;
▪ Energy and efficiency tests,including LED/AMOLED,solar cells,DC-DC converters,etc.;
▪ Sensor characteristic test,including resistivity,Hall effect,etc.;
▪ Organic materials characteristic test,including electronic ink,printed electronic technology,etc.;
▪ Nanomaterials characteristics test,including graphene,nanowires,etc.
Video
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