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| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CS401 |
| MOQ: | 1 unit |
| Delivery Time: | 2-8 weeks |
| Payment Terms: | T/T |
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
The CS400 is a modular SMU solution engineered for high-volume device testing, featuring an innovative common-ground architecture with 4 channels per subcard. When integrated with the CS1010C host system, it achieves synchronized control of up to 40 channels—reducing system integration costs by 50% compared to traditional single-channel instruments. Optimized for high-throughput applications including LED/OLED production-line aging tests and semiconductor wafer multi-probe parallel inspection.
Product Features
▪ ±0.1% Basic Accuracy: Maintains precision across full ranges in both sourcing and sinking modes.
▪ Multi-functional Operation: Combines voltage/current sourcing, voltmeter/ammeter, and electronic load capabilities.
▪ Programmable Trigger I/O: Configurable trigger polarity (rising/falling edge) for automated test sequencing.
▪ Independent Channel Control: Each channel operates autonomously for mixed-device testing scenarios.
▪ Space-efficient Design: Compact modular architecture maximizes rack density in production environments.
▪SCPI Compatibility: Standard command set enables seamless integration with LabVIEW/Python automation frameworks.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
1~10V |
|
Minimum Voltage Resolution |
100uV |
|
Current Range |
5uA～500mA |
|
Minimum Current Resolution |
500pA |
|
Maximum Continuous Wave (CW) Output Power |
Channel 5W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:Static/dynamic parameter analysis of discrete devices (MOSFETs, diodes, BJTs).
▪ Nanomaterials & Organic Electronics:Resistivity and Hall-effect testing for graphene, nanowires, and e-ink materials.
▪ Energy Device Evaluation:Efficiency testing and I-V curve scanning for solar cells, DC-DC converters, and batteries.
▪ Sensor Calibration:Sensitivity and response characterization of gas-sensitive/pressure-sensitive resistors and temperature sensors.
▪ Multi-channel Parallel Testing:LED/AMOLED panel aging tests and high-volume production QA for multi-device batch validation.
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|
| Brand Name: | PRECISE INSTRUMENT |
| Model Number: | CS401 |
| MOQ: | 1 unit |
| Packaging Details: | Carton. |
| Payment Terms: | T/T |
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
The CS400 is a modular SMU solution engineered for high-volume device testing, featuring an innovative common-ground architecture with 4 channels per subcard. When integrated with the CS1010C host system, it achieves synchronized control of up to 40 channels—reducing system integration costs by 50% compared to traditional single-channel instruments. Optimized for high-throughput applications including LED/OLED production-line aging tests and semiconductor wafer multi-probe parallel inspection.
Product Features
▪ ±0.1% Basic Accuracy: Maintains precision across full ranges in both sourcing and sinking modes.
▪ Multi-functional Operation: Combines voltage/current sourcing, voltmeter/ammeter, and electronic load capabilities.
▪ Programmable Trigger I/O: Configurable trigger polarity (rising/falling edge) for automated test sequencing.
▪ Independent Channel Control: Each channel operates autonomously for mixed-device testing scenarios.
▪ Space-efficient Design: Compact modular architecture maximizes rack density in production environments.
▪SCPI Compatibility: Standard command set enables seamless integration with LabVIEW/Python automation frameworks.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
1~10V |
|
Minimum Voltage Resolution |
100uV |
|
Current Range |
5uA～500mA |
|
Minimum Current Resolution |
500pA |
|
Maximum Continuous Wave (CW) Output Power |
Channel 5W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Semiconductor Device Testing:Static/dynamic parameter analysis of discrete devices (MOSFETs, diodes, BJTs).
▪ Nanomaterials & Organic Electronics:Resistivity and Hall-effect testing for graphene, nanowires, and e-ink materials.
▪ Energy Device Evaluation:Efficiency testing and I-V curve scanning for solar cells, DC-DC converters, and batteries.
▪ Sensor Calibration:Sensitivity and response characterization of gas-sensitive/pressure-sensitive resistors and temperature sensors.
▪ Multi-channel Parallel Testing:LED/AMOLED panel aging tests and high-volume production QA for multi-device batch validation.
Video
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