Video Channel of China Wuhan Precise Instrument Co., Ltd.
Chat Now Contact Us
Home videos Playlist About Us Official Web
English
English
French
German
Italian
Russian
Spanish
Portuguese
Dutch
Greek
Japanese
Korean
Polish
Persian
Bengali
Thai
Vietnamese
Arabic
Hindi
Turkish
Indonesian
loading

18V/1A Four-channel Sub Card Pulse Source Measure Unit CBI403

Multi Channel Test Equipment
February 24, 2025
Chat Now
Introducing the CBI403, a high-precision four-channel subcard pulse source measure unit designed for advanced electrical characterization, offering 0.1% accuracy and 5½-digit resolution, with four-quadrant operation, dual testing modes, and high channel density, ideal for semiconductor wafer-level validation and multi-device parallel stress testing, Welcome to visit our website!
Multi Channel Test Equipment
Related Videos
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401 00:26
10V/500mA Four-channel Sub Card DC Source Measure Unit CS401

10V/500mA Four-channel Sub Card DC Source Measure Unit CS401
Multi Channel Test Equipment
February 24, 2025
10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401 00:24
10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401

10V/500mA Four-channel Sub Card Pulse Source Measure Unit CBI401
Multi Channel Test Equipment
February 24, 2025
10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402 00:24
10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402

10V/1A Four-channel Sub Card Pulse Source Measure Unit CBI402
Multi Channel Test Equipment
February 24, 2025
LDBI Multi-Channel High-Power Laser Aging System 00:34
LDBI Multi-Channel High-Power Laser Aging System

LDBI Multi-Channel High-Power Laser Aging System
Semiconductor Test Systems
February 26, 2025
PRECISE Instrument | Source of Exploration Internal and External Consistency 01:24
PRECISE Instrument | Source of Exploration Internal and External Consistency

PRECISE Instrument | Source of Exploration Internal and External Consistency

Other Videos
February 17, 2025
300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials 00:24
300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials

300V/4A/30A Pulse Source Measure Unit P300B for Semiconductors and Materials
Source Measure Unit
February 24, 2025
1000A Current Sensor Test System CTMS 00:24
1000A Current Sensor Test System CTMS

1000A Current Sensor Test System CTMS
Semiconductor Test Systems
February 26, 2025
300V/3A Semiconductor Testing DC Source Measure Unit S300B 00:24
300V/3A Semiconductor Testing DC Source Measure Unit S300B

300V/3A Semiconductor Testing DC Source Measure Unit S300B
Source Measure Unit
February 24, 2025
300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300 00:24
300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300

300V/1A/10A Semiconductor Testing Four-Quadrant Operation Pulse Source Meter P300
Source Measure Unit
February 24, 2025
30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100 00:36
30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100

30V/1A Semiconductor Electrical Characteristics Testing DC Source Measure Unit S100
Source Measure Unit
February 24, 2025