10kV/6000A Power Device Analyzer Static Test System PMST For MOSFET BJT IGBT And SiC GaN Semiconductors
Introducing the PMST, a 10kV/6000A Power Device Analyzer Static Test System designed for precise testing of MOSFET, BJT, IGBT, and SiC GaN semiconductors, featuring high-voltage and high-current characteristics, μΩ-level precision measurement, and nA-level current measurement capabilities, supporting junction capacitance measurements and modular configuration for flexible testing, welcome to visit our website!
Semiconductor Test Systems
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10kV/6000A Power Device Analyzer Static Test PMST For Mosfet BJT IGBT SiC GaN Semiconductor
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